Article Archives - Page 2 of 3 - ARkival Technology Magnetics Lab

Remanence, Retentivity or Remanent Magnetization

Note magnetic parameter Retentivity, Magnetic Remanence , remanent magnetization, Retentivity or residual magnetism is the magnetization left behind in a ferromagnetic material (such as iron) after an external magnetic field is removed. After certain classes of magnet material are “magnetized” they have remanence. The remanence of magnetic materials provides the magnetic memory in magnetic storage devices, and in common magnets or easily magnetized materials. In cases…
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Hysteresis Loop Measurements

Note magnetic parameters of Coercivity, Saturation & Remanence The Magnetic Hysteresis loop is the most important and significant data graph resulting from the testing of magnetic Materials and their properties. The Hysteresis loop is obtained using a precision magnetometer (Vibrating Sample Magnetometer[VSM]) using NIST and other standardized references and materials to assure relevancy of reported…
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Magnetic Field Mapping

Magnetic Field Mapping Many magnet applications use permanent magnets or electromagnets to provide a magnetic field for an attractive or repulsive interaction. Magnetic field data is required for product designs and applications where product function is based upon magnetic strength, the magnetized pole geometry, the external field shape, and magnitude at the working distance(s) in…
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Torque Measurements

ARkival’s Torque Measurements are performed with a MicroSense VSM employing an ultra-low friction, air bearing suspending the sample with virtually zero friction. The resulting torque measurement reports the actual force on the sample. All pre-measurement calibrations are directly based upon a known torque sample. ARkival’s magnetic torque measurements can accommodate solid, bulk, and thin film…
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Magnetic Thermal Annealing (MTA)

ARkival’s Magnetic Thermal Annealing (MTA) process is used to enhance the performance of magnetic materials and components. During their manufacture, preparation and processing the crystalline and magnetic structures of these materials can assume moderate to high degrees of disorder. The process of controlled magnetic thermal annealing can remove these disorders and can often provide substantially improved magnetic performance of the materials and even their devices (e.g., spintronic devices). The heating of a magnetic…
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TEM (Transmission Electron Microscope)

Transmission electron microscopy (TEM) is a very high imaging magnification also performed with an electron microscope to view thin material cross-sections and specimens (nanoparticles, tissue sections, molecules, etc) through which electrons can pass generating a projection image. TEM is analogous in many ways to the conventional (compound) light microscope with greater magnification and detail. Image Magnification from…
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EDAX (Energy Dispersive Analysis by X-Ray (EDX, EDS)

A typical EDX SPECTRA (elemental) result is shown in photo at left. The elemental spectral peaks are identified during the x-ray scan. The individual elements are indicated in the spectra by both their intensity and scan position. The greater the intensity, the higher the element concentration in the sample. The spectra shown illustrates the elemental…
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SEM (Scanning Electron Microscope)

Scanning electron microscopy (SEM) is a very high imaging magnification performed with an electron microscope that produces informative images of magnetic samples by scanning them with a focused beam of electrons. The electrons interact with atoms in the sample, producing highly magnified images of the sample’s surface topography and composition. Image Magnification from an SEM can be controlled from 10 to…
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MFM (Magnetic Force Microscopy)

MFM is a magnetic measurement technology for imaging various magnetic structures including magnetic domains, domain walls (Bloch and Neel), recorded magnetic bits and magnetic surface structures and abnormalities. MFM studies are performed with and/or without the presence of an external magnetic field. MFM imaging of various materials such as thin films, nanoparticles, nanowires, permalloy disks…
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ICP (Inductively Coupled Plasma) Analysis & Spectrometry

ICP-AES is a measurement technique that ARkival uses to determine elemental concentrations in materials from minute trace amounts to major compositions. Statistical concentration data results can be obtained for about 70 elements with detection limits in the parts per billion range. ICP-MS is a type of mass spectrometry that ARkival uses for detecting metals and several non-metals at…
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Category: Article

Remanence, Retentivity or Remanent Magnetization

Hysteresis Loop Measurements

Magnetic Field Mapping

Torque Measurements

Magnetic Thermal Annealing (MTA)

TEM (Transmission Electron Microscope)

EDAX (Energy Dispersive Analysis by X-Ray (EDX, EDS)

SEM (Scanning Electron Microscope)

MFM (Magnetic Force Microscopy)

ICP (Inductively Coupled Plasma) Analysis & Spectrometry

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