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MFM (Magnetic Force Microscopy)

MFM is a magnetic measurement technology for imaging various magnetic structures including magnetic domains, domain walls (Bloch and Neel), recorded magnetic bits and magnetic surface structures and abnormalities. MFM studies are performed with and/or without the presence of an external magnetic field.

MFM imaging of various materials such as thin films, nanoparticles, nanowires, permalloy disks and recording media are commonly performed. The technology does not require the sample to be electrically conductive and measurements are performed at ambient temperature, in ultra-high vacuum (UHV), or in a liquid environment, at different temperatures, and in the presence of external magnetic fields.

The Measurement is nondestructive to the crystal lattice or structure and is typically insensitive to minor surface contamination. No special surface preparation or coating is required.

Sample are usually scanned twice. The first scan of the surface presents the topography of the sample. In secondary scans, the magnetic tip-sample distance is increased and when scanned along the initial topography line and is only affected by the magnetic forces. The signals are electronically configured to obtain the MFM image.

This form of cantilever magnetometry (MFM) can also be used for characterizing magnetic samples and as technique to characterize the magnetic properties of materials and measure the magnetic dissipation in magnetic materials. The magnetization of individual magnetic nanoparticles (MNP) can also be determined with MFM for applications in nanomagnetism used pharma-delivery, MRI diagnostics and biotechnology.

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