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SEM (Scanning Electron Microscope)

Scanning electron microscopy (SEM) is a very high imaging magnification performed with an electron microscope that produces informative images of magnetic samples by scanning them with a focused beam of electrons. The electrons interact with atoms in the sample, producing highly magnified images of the sample’s surface topography and composition.

Image Magnification from an SEM can be controlled from 10 to 300,000 times. In magnetics, ARkival uses SEM micrograph images regularly to study minute structures, nanoparticles, minute structural detail, surface areas of materials, biological specimens and more.

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