Transmission electron microscopy (TEM) is a very high imaging magnification also performed with an electron microscope to view thin material cross-sections and specimens (nanoparticles, tissue sections, molecules, etc) through which electrons can pass generating a projection image. TEM is analogous in many ways to the conventional (compound) light microscope with greater magnification and detail.
Image Magnification from an TEM can be controlled from 10 to 300,000 times. In magnetics, ARkival uses TEM micrograph images regularly to study minute structures, nanoparticles, minute structural detail and more. See MNP images