Scanning electron microscopy (SEM) is a very high imaging magnification performed with an electron microscope that produces informative images of magnetic samples by scanning them with a focused beam of electrons. The electrons interact with atoms in the sample, producing highly magnified images of the sample’s surface topography and composition. Image Magnification from an SEM can be controlled from 10 to […]
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MFM (Magnetic Force Microscopy)
MFM is a magnetic measurement technology for imaging various magnetic structures including magnetic domains, domain walls (Bloch and Neel), recorded magnetic bits and magnetic surface structures and abnormalities. MFM studies are performed with and/or without the presence of an external magnetic field. MFM imaging of various materials such as thin films, nanoparticles, nanowires, permalloy disks […]